Temperature-sensitive spatial distribution of defects in <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mi>Pd</mml:mi><mml:msub><mml:mi>Se</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math> flakes

Defect engineering plays an important role in tailoring the electronic transport properties of van der Waals materials. Methods reported so far mainly rely on $e\phantom{\rule{0}{0ex}}x\phantom{\rule{0.333em}{0ex}}s\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}t\phantom{\rule{0}{0ex}}u$ defect type and concentration, hindering realization new types device functionalities associated with engineering. Here, authors report temperature-sensitive spatial redistribution defects PdSe${}_{2}$ thin flakes through scanning tunneling microscopy. The characteristics distribution is strongly related to such as anisotropic carrier mobility phase coherent length, indicating a different avenue for creating novel based $i\phantom{\rule{0}{0ex}}n\phantom{\rule{0.333em}{0ex}}s\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}t\phantom{\rule{0}{0ex}}u$ modulation distribution.